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ANSI INCITS 322-2002 information technology - card durability test methods iti; revision of ansi ncits 322-1998

Standard Number:  ANSI INCITS 322-2002
Title:  information technology - card durability test methods iti; revision of ansi ncits 322-1998
Language:  English
Publication Date:  2002/6/10
Status:  Withdrawn
Publisher:  American Nuclear Society Specificatioin
Price:  
Number of Pages:52  

Description:This American National Standard describes Test Methods for the evaluation of Identification (ID) card durability. An ID card is defined as a card identifying its holder and issuer which may carry data required as input for the intended use of the card.  
Catalog:Foreword
1 Scope
2 Normative References
3 Default Test Environment And Conditioning
4 Definitions
5 Test Methods
5.1 Delamination - 180 degree
5.2 Delamination - 90 degree
5.3 Delamination - Cross Hatch Tape Test
5.4 ID-1 Card Flexure
5.5 ID-1 Card Static Stress
5.6 ID-1 Card Stress & Plasticizer Exposure
5.7 Impact Resistance
5.8 Elevated Temperature & Humidity Exposure
5.9 Surface Abrasion
5.10 Bar Code Abrasion (1D)
5.11 Magnetic Stripe Abrasion
5.12 Image Abrasion
5.13 Temperature & Humidity Induced Dye Migration
5.14 Plasticizer Induced Dye Migration
5.15 Ultraviolet (UV) Light Exposure
5.16 Daylight Exposure Image Stability - Xenon Arc
5.17 Laundering Test
5.18 Embossed Character Retention - Pressure
5.19 Embossed Character Retention - Heat
5.20 Corner Impact Test
5.21 Wet Abrasion & Impact
5.22 IC Card with Contacts Micromodule Adhesion
6 Test Sequences
6.1 Card Structure Integrity Test Sequence
Annex
A Bibliography  
File Format:  PDF(Acrobat Reader) or Word version doc Document
File Size:  447KB
Tile in English:  information technology - card durability test methods iti; revision of ansi ncits 322-1998

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