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JIS H0614-1996 Visual inspection for silicon wafers with specular surfaces

Standard Number:  JIS H0614-1996
Title:  Visual inspection for silicon wafers with specular surfaces
Language:  Japanese
Publication Date:  1996/1/1
Execute Date:  1996/1/1
Status:  Current
Publisher:  Japanese Standards Association (JSA JIS)
Price:  
Number of Pages:8P;A4   

Description:   
File Format:  PDF(Acrobat Reader) or Word version doc Document
File Size:  729KB
Tile in English:  Visual inspection for silicon wafers with specular surfaces

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