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BS 6493-1.1-1984 semiconductor devices - discrete devices - general

Standard Number:  BS 6493-1.1-1984
Title:  semiconductor devices - discrete devices - general
Language:  English
Replaced by Standard:  BS IEC 60747-1-2006+A1-2010

Publication Date:  1984/5/31
Execute Date:  1984/1/1
Status:  withdrawn
International Classification for Standards (ICS)ELECTRONICS>>Semiconductor devices>>Semiconductor devices in general
Publisher:  British Standards
Price:  
Number of Pages:64  

Description:Publications 747 are intended to give: - standards that are generally vaid for discrete devices as well as for integrated circuits; - additional standards to complete the set of standards for discrete devices.  
Cross References:BS 2011, BS 2045, BS 3934, BS 4200-Part 3, BS 4727, BS 6493-Part 2, IEC 60027, IEC 60134  
Catalog:Committees responsible
National foreword
Chapter I. Scope and presentation of IEC
publications 747 and 748
1 Publications 747
1.1 Scope
1.2 Presentation
2 Publications 748
2.1 Scope
2.2 Presentation
Chapter II. Purpose and presentation of publication
747-1
1 Purpose
2 Presentation
Chapter III. Purpose, presentation and requirements
on the contents of publications 747-2,
747-3, etc.
1 Purpose of each part
2 Presentation of each part
2.1 Subdivision into chapters
2.2 Subdivision into device sub-categories
3 Requirements on the different chapters of each part
3.1 Requirements on Chapter I, General
3.1.1 Purpose
3.2 Requirements on Chapter II, Terminology and
letter symbols
3.2.1 Purpose
3.2.2 Validity of terms, definitions and
letter symbols
3.2.3 Letter symbols
3.3 Requirements on Chapter III, Essential ratings
and characteristics
3.3.1 Purpose
3.4 Requirements on Chapter IV, Measuring methods
3.4.1 Purpose
3.5 Requirements on Chapter V, Acceptance and
reliability
3.5.1 Purpose
Chapter IV. Terminology, general
1 Introduction
2 Physical terms
3 General terms
4 Types of devices
5 Terms related to ratings and characteristics
5.1 Currents and voltages
5.2 Temperatures
5.3 Thermal characteristics
5.4 Noise
5.5 Various terms
5.6 Terms characterizing the constant value or
periodic waveforms of currents and voltages
6 Pulse terms and definitions
7 Input-to-output pulse switching times, general
terms
Chapter V. Letter symbols, general
1 Introduction
2 Letter symbols for currents, voltages and powers
3 Letter symbols for electrical parameters
4 Letter symbols for other quantities
5 Letter symbols for logarithmic scale units for
signal ratios expressed in dB
Chapter VI. Essential ratings and characteristics,
general
1 Introduction
2 Standard format for the presentation of published
data
3 Definitions
4 Definitions of cooling conditions
5 List of recommended temperatures
6 List of recommended voltages and currents
7 Mechanical ratings, characteristics and other data
8 Standardization of the position of terminals on
bases of semiconductor devices
9 Colour coding of terminals for semiconductor
devices
10 General information applicable to multiple devices
having a common encapsulation
11 Production spread and compliance
12 Printed wiring and printed circuits
Chapter VII. General and reference measuring methods,
general
Section 1. General measuring methods
1 Introduction
2 General precautions
2.1 Protection of devices and measuring
equipment
2.2 Accuracy of measurement
2.3 Definitions
Section 2. Reference measuring methods
1 Guide for reference measuring methods
2 Thermal conditions for electrical reference
measuring methods
2.1 Introduction
2.2 Conditions in case of negligible power
dissipation in the device
2.3 Conditions in case of significant power
dissipation in the device
Chapter VIII. Acceptance and reliability of
discrete devices
Section 1. General
Section 2. General principles (Under consideration)
Section 3. Electrical endurance tests
1 Purpose and presentation
2 General requirements
2.1 Conditions for endurance tests
2.2 Duration of test
2.3 Failure-defining characteristics and
measurements
2.4 Failure criteria
2.5 Precautions
3 Specific requirements. General
3.1 List of endurance tests
3.2 Conditions for endurance tests
3.3 Failure-defining characteristics and failure
criteria for acceptance after endurance tests
3.4 Failure-defining characteristics and failure
criteria for reliability tests (under
consideration)
3.5 Procedure in case of a testing error
3.6 Information to be given in Table I and Table II
Chapter IX. Electrostatic-sensitive devices
1 Handling precautions
2 Label and symbol
3 Test methods for electronic devices sensitive to
voltage pulses of short duration  
File Format:  PDF(Acrobat Reader) or Word version doc Document
File Size:  980KB
Tile in English:  semiconductor devices - discrete devices - general

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