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ESD SP5.3.2-2008 Electrostatic Discharge Sensitivity Testing - Socketed Device (Sdm) - Component Level

Standard Number:  ESD SP5.3.2-2008
Title:  Electrostatic Discharge Sensitivity Testing - Socketed Device (Sdm) - Component Level
Language:  English
Replaced by Standard:  ESD SP5.3.2:2013

Replacing Standard:  ESD SP5.3.2:2004

Status:  Withdrawn
Publisher:  Other Standards
Price:  
Number of Pages:20  

Description:Gives a test method for generating a Socketed Device Model (SDM) test on a component integrated circuit (IC) device.  
Catalog:1.0 PURPOSE AND SCOPE
1.1 PURPOSE
1.2 SCOPE
2.0 REFERENCES
3.0 DEFINITIONS
4.0 REQUIRED EQUIPMENT
4.1 SOCKETED DEVICE MODEL (SDM) ESD TESTER
4.2 WAVEFORM VERIFICATION EQUIPMENT
5.0 EQUIPMENT CALIBRATION AND VERIFICATION
REQUIREMENTS
5.1 EQUIPMENT CALIBRATION
5.2 TESTER VERIFICATION
6.0 EQUIPMENT QUALIFICATION AND VERIFICATION
PROCEDURES
6.1 WAVEFORM VERIFICATION PROCEDURE
6.2 TESTER QUALIFICATION AND RE-QUALIFICATION
PROCEDURE
6.3 RECOMMENDED TESTER FUNCTIONALITY CHECK
7.0 SDM TESTING RECOMMENDATIONS
7.1 COMPONENT HANDLING
7.2 COMPONENT STATIC AND DYNAMIC TESTS
7.3 TEST TEMPERATURE
7.4 SAMPLE SIZE
7.5 PIN STRESSING
8.0 SDM ESD STRESS TESTING PROCEDURE
8.1 TEST PRACTICE
9.0 FAILURE CRITERIA
10.0 SDM WAVEFORM PARAMETERS
ANNEX A: WAVEFORM VERIFICATION LIMIT PROCEDURE  
File Format:  PDF(Acrobat Reader) or Word version doc Document
File Size:  357KB
Tile in English:  Electrostatic Discharge Sensitivity Testing - Socketed Device (Sdm) - Component Level

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