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ASME B46.1-2002 Surface Texture, Surface Roughness, Waviness, And Lay

Standard Number:  ASME B46.1-2002
Title:  Surface Texture, Surface Roughness, Waviness, And Lay
Language:  English
Replaced by Standard:  ASME B46.1:2009

Replacing Standard:  MIL STD 10

Status:  Withdrawn
Publisher:  American Society of Mechanical Engineers (ASME)
Price:  
Number of Pages:110  

Description:Describes surface texture and its constituents- roughness, waviness, and lay. Also defines parameters for specifying surface texture.  
Catalog:Standard committee roster
1 Terms related to surface texture
1.1 Scope
1.2 Definitions related to surfaces
1.3 Definitions related to the measurement of
surface texture by profiling methods
1.4 Definitions of surface parameters for profiling
methods
1.5 Definitions related to the measurement of
surface texture by area profiling and area
averaging methods
1.6 Definitions of surface parameters for area
profiling and area averaging methods
2 Classification of instruments for surface texture
measurement
2.1 Scope of section 2
2.2 Recommendation
2.3 Classification scheme
3 Terminology and measurement procedures for
profiling, contact, skidless instruments
3.1 Scope of section 3
3.2 References
3.3 Terminology
3.4 Measurement procedure
4 Measurement procedures for contact, skidded
instruments
4.1 Scope of section 4
4.2 References
4.3 Purpose
4.4 Instrumentation
5 Measurement techniques for area profiling
5.1 Scope of section 5
5.2 Recommendations
5.3 Imaging methods
5.4 Scanning methods
6 Measurement techniques for area averaging
6.1 Scope of section 6
6.2 Examples of area averaging methods
9 Filtering of surface profiles
9.1 Scope of section 9
9.2 References
9.3 Definitions and general specifications
9.4 2RC filter specification for roughness
9.5 Phase correct gaussian filter for roughness
9.6 Filtering for waviness
11 Specifications and procedures for precision
reference specimens
11.1 Scope of section 11
11.2 References
11.3 Definitions
11.4 Reference specimens: profile shape and application
11.5 Physical requirements
11.6 Assigned value calculation
11.7 Mechanical requirements
11.8 Marking
12 Specifications and procedures for roughness
comparison specimens
12.1 Scope of section 12
12.2 References
12.3 Definitions
12.4 Roughness comparison specimens
12.5 Surface characteristics
12.6 Nominal roughness grades
12.7 Specimen size, form, and lay
12.8 Calibration of comparison specimens
12.9 Marking
Figures
1-1 Schematic diagram of surface characteristics
1-2 Measured vs nominal profile
1-3 Stylus profile displayed with two different
aspect ratios
1-4 Examples of nominal profiles
1-5 Filtering a surface profile
1-6 Profile peak and valley
1-7 Surface profile measurement lengths
1-8 Illustration for the calculation of roughness
average Ra
1-9 Rt, Rp, and Rv parameters
1-10 Surface profile containing two sampling lengths
l1 and l2, also showing the Rpi and Rti parameters
1-11 The Rt and Rmax parameters
1-12 The waviness height, Wt
1-13 The mean spacing of profile irregularities, Sm
1-14 The peak count level, used for calculating
peal density
1-15 Amplitude density function - ADF(z) or p(z)
1-16 The profile bearing length
1-17 The bearing area curve and related parameters
1-18 Three surface profiles with different skewness
1-19 Three surface profiles with different kurtosis
1-20 Topographic map obtained by an area profiling
method
1-21 Area peaks (lift) and area valleys (right)
1-22 Comparison of profiles measured in two directions
on a uniaxial, periodic surface showing the
difference in peak spacing as a function of
direction
Tables
1 Measurement traversing lengths
2 Long wavelength percent transmission limits
3 Tolerances for roughness comparison specimens
Appendices
A General notes on use and interpretation of tracer
instruments
B Control and production of surface texture
C A review of surface measurement methods and
parameters
Figures
A1 Effects of various cutoff values
B1 Surface roughness produced by common production
methods
C1 Principle of capacitance between parallel plates
C2 Comparison of roughness void volumes
C3 Schmaltz profile microscope
C4 Reflectance measurement
C5 Total integrated scatter measurement
C6 Double objective interferometer
C7 Single objective interferometer
C8 Multiple-beam interferometer
C9 Differential contrast photograph of automobile
engine cylinder wall
C10 Differential interferometry
C11 Zehender method
C12 Comparison of optical and transmission electron
microscope
C13 Diagram of scanning electron microscope
C14 Roughness average
C15 Short section of hypothetical profile divided into
increments
C16 Root-mean-square (rms) roughness Rq
C17 Maximum peak-to-valley roughness height
C18 Ten-point height
C19 Average peak-to-valley roughness
C20 Average spacing of roughness peaks
C21 Swedish height of irregularities
C22 Bearing length ratio
C23 Leveling depth
C24 Waviness height
C25 Peak count
C26 Amplitude density function (ADF)
C27 Bearing area curve (BAC)
C28 Relationship of amplitude sensitive parameters
C29 Profile symmetry about mean
C30 Kurtosis
C31 Measured profiles and their ACF diagrams
Table
C1 International parameters, symbols, and their
countries
Index  
File Format:  PDF(Acrobat Reader) or Word version doc Document
File Size:  447KB
Tile in English:  Surface Texture, Surface Roughness, Waviness, And Lay

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