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Search Home >> British Standards >> BS EN 60749-28-2017 Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level

BS EN 60749-28-2017 Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level

Standard Number:  BS EN 60749-28-2017
Title:  Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level
Language:  English
Publication Date:  2017/7/10
Adopted International Standard:  EN 60749-28-2017,IEC60749-28-2017
International Classification for Standards (ICS)ELECTRONICS>>Semiconductor devices>>Semiconductor devices in general
Publisher:  British Standards
Price:  
Number of Pages:48  

Cross References:IEC 60749-26-2013 ED3, EN 60749-26 (IEC 60749-26-2013) AS  
File Format:  PDF(Acrobat Reader) or Word version doc Document
File Size:  466KB
Tile in English:  Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Charged device model (CDM). Device level

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